Ion implantation of silicon carbide is a technique used to introduce specific impurity atoms in silicon carbide materials.Ion implantation typically implants desired dopants into silicon carbide crystals by means of a high-energy ion beam.
The ion implantation process includes the following steps:
1. Select the target impurity atoms to be implanted, usually boron (B), nitrogen (N) or phosphorus (P), etc.
2. Prepare the SiC substrate and film to support and protect the ion implantation process.
3. Use an ion implanter to introduce a high-energy ion beam into the silicon carbide material. A beam of ions passes through the membrane and is implanted into the silicon carbide crystal.
4. After the implantation is completed, other process steps such as annealing, cleaning, and electrode formation are used to convert the ion-implanted material into a functional device.
Selective doping technology is a method of controlling the ion implantation process.It uses photolithography and film technology to precisely define and control the ion implantation area during the manufacturing process. Masks are created in targeted areas by applying photoresist to specific areas and performing steps such as exposure and development. This mask prevents ions from entering the material from the protected areas, enabling selective doping. Selective doping techniques can be used to create specific doped regions in silicon carbide materials, thereby optimizing the material's electronic properties and device performance.
All in all, the ion implantation of silicon carbide is a technology that introduces specific impurity atoms into the material, and the selective doping technology is a method of controlling the ion implantation process. Doping is achieved in a specific area through mask technology to achieve Optimizing the performance of silicon carbide materials.