Does the BMS control board exhibit control logic disorder during the 150kHz-80MHz conducted immunity test?

The control logic malfunction observed during conducted immunity testing indicates that high-frequency interference is affecting core components such as the MCU through power supply or I/O line coupling. The main causes include poor power integrity and interference with critical signal lines. Hardware countermeasures include using ferrite beads and multi-value capacitors to form a π-type filter network at the power input and power branches of each functional module, such as using CBL series ferrite beads with 10μF and 0.1μF MLCC capacitors. Ferrite beads or small series resistors are added to the clock line for filtering, and a small capacitor is added to ground on the reset line. Ensuring a complete ground plane on the multilayer board provides a low-impedance return path for high-frequency noise. These measures improve the system's stability under strong interference.