How to solve the problem of the edge box crashing during radiation immunity testing?

The edge box crashing during the 10V/m radiated immunity test is usually caused by CPU or DDR interference, leading to reset or program crashes. The solution is as follows: First, connect a PBZ1608E600Z0T ferrite bead (60Ω, 100MHz) in series with the reset signal line to suppress high-frequency induced current and place it close to the chip pins. Second, add an RC filter to the clock source, ground the crystal oscillator casing, and connect a 22Ω resistor in parallel to reduce the drive amplitude. Third, use an LC filter for the DDR power supply, connecting a CML3225A-101T common-mode inductor in series. The CML common-mode inductor is 3225, 3.2×2.5mm, 101T, with an inductance of 100μH, and a 10μF capacitor to form a π-type filter. Fourth, check the shielding structure for excessive gaps and add conductive foam with a 30% compression to ensure continuous conductivity. For the stringent IEC61000-4-3 20V/m test, the high permeability shielding material from Etymex can be upgraded. After verification, the crash threshold after adding the ferrite bead to the reset line increased from 8V/m to 25V/m, passing the test.