
During the PCS development phase, using pre-testing tools for rapid EMC screening can identify problems early and save on later rectification costs. Common tools and methods include:
1. Near-field probe kit: Used with a spectrum analyzer to quickly scan the electromagnetic field distribution of the PCB, cables, and chassis to locate strong radiation sources.
2. Current probe: Clipped onto input/output cables to measure conducted noise current and evaluate filtering effectiveness.
3. Desktop LISN (or artificial power network): Simulates standard test conditions in the R&D laboratory to perform conducted emission pre-testing.
4. Oscilloscope and differential probe: Observes and measures switching waveforms (such as Vds, Vce) at key nodes to evaluate dv/dt, di/dt, and ringing, which are sources of noise.
5. Impedance analyzer: Measures the impedance-frequency characteristics of filters, capacitors, and common-mode inductors to verify their performance.
6. Small shielding room or absorbing materials: Performs simple radiated emission pre-scans. With these tools, engineers can conduct multiple rounds of evaluation and optimization before product testing.