How can EPS pre-testing quickly screen for EMC issues?

During the EPS development phase, using pre-testing tools for rapid EMC screening can identify problems early and save later costs. Common tools and methods include:

1. Near-field probe kit: Used with a spectrum analyzer to quickly scan the electromagnetic field distribution of the PCB, cables, and chassis, locate strong radiation sources, and qualitatively evaluate the effectiveness of rectification.

2. Current probe: Clipped onto input/output cables to measure conducted noise current and evaluate filtering effectiveness.

3. Desktop LISN (Artificial Power Network): Set up a simple conducted emission test environment in the R&D laboratory for pre-testing.

4. Oscilloscope and probes: Observe the switching waveforms (such as Vds, Vce) of key nodes to evaluate dv/dt, di/dt, and ringing.

5. Impedance analyzer: Measure the impedance-frequency characteristics of filters, capacitors, and common-mode inductors to verify whether their performance meets design requirements.

6. Small shielding room or absorbing materials: Perform simple radiated emission pre-scans. These tools help engineers conduct multiple rounds of evaluation and optimization before submitting for inspection.