Will data center switch configuration be lost during immunity testing?

Inadequate protection design in data center switch immunity testing (ESD/EFT/surge/RS/CS) may cause CPU register data flipping, leading to configuration loss.

Risk path: Interference couples to the CPU via power supply or reset line, causing the enable pin to mistakenly enter programming mode.

Protection scheme: A TVS such as the ESD5V0D3B (VRWM=5V, junction capacitance 45pF) is connected in parallel to the CPU power pin to clamp transients; a PBZ1005B-601Z0T (600Ω@100MHz) ferrite bead is connected in series to the reset pin; an ultra-low capacitance TVS ESDTLC5V0D8B (0.2pF) is added to the I²C bus for protection; firmware enables BIST self-test, and configuration parameters are written to Flash for verification every hour.

Actual testing showed that after all immunity tests, configuration recovery time was <2 seconds with no loss.